Scope and metrics
Metrology and Measurement Systems is an international journal, peer-reviewed, quarterly-published, launched in 1988. Since 2001 it has appeared in English. The journal is published both in the paper and electronic form on the Electronic Library platform of the Polish Academy of Sciences.
The Journal is indexed in Journal Citation Reports and Web of Science Master Journal List (Clarivate Analytics formerly Thomson Reuters), INSPEC, Scopus, Index Copernicus, Google Scholar, CSA Technology Research, High Tech Research Database, Solid State & Superconductivity.
Impact Factor for 2020: 1. 155
5-Year Impact Factor: 1.194
The Polish Ministry of Science and Higher Education: 100 points
Contributions are invited on all aspects of research, development and applications of the measurement science and associated technology.
The list of topics covered includes: theory, general principles and applications of measurement; measurement of physical, chemical and biological quantities; medical measurements; sensors and transducers; measurement data acquisition; measurement signal transmission; processing and data analysis; measurement systems and embedded systems; design, manufacture and evaluation of measurement instrumentation. Manuscripts sent for publication in the journal should emphasize the novelty of presented methods and/or techniques, and demonstrate their performance through experimental tests, reliable simulations or numerical examples. Articles directly concerning measurement process should contain adequate analysis of measurement uncertainty.
A cover letter with clear explanation of scientific novelty, significance and utility of solutions proposed in the manuscript sent for publication is strongly recommended. Articles based on substantially extended and updated contributions presented at scientific conferences, or strongly related to previous authors’ works, must be accompanied with a cover letter file which should explain in details changes made in the manuscript in comparison with original conference paper and highlight the novelty in reference to other authors’ works.
The average publication cycle is 6 months.
Metrology and Measurement Systems welcomes submissions of the following article types:
- invited special issue or review papers presenting the current stage of the knowledge within the scope of the journal
(about 20 edited pages, approximately 3000 characters each),
- research papers reporting high-quality original scientific or technological advancements (max. 12 pages),
- papers based on extended and updated contributions presented at scientific conferences (max. 12 pages),
- short notes, i.e. book reviews, conference reports, short news (max. 2 pages).
Metrology and Measurement Systems is a quarterly journal and publishes 4 issues per year. However, articles accepted for publication are published in electronic version immediately (with assigned DOI number).
Each submitted manuscript is subject to a single-blind peer-review procedure, in which the reviewers know the identity of the authors, but the authors do not know the identity of the reviewers. The publication decision is based on the reviewers’ comments. If necessary, the authors may be invited to revise their manuscripts. On acceptance, manuscripts are subject to editorial amendment to exactly fit the journal style.
Our Internet Editorial System website provides Authors with up-to-date information on progress of reviewing process.
Metrology and Measurement Systems is an open access journal. The Author hereby grants the Polish Academy of Sciences (the Journal Owner) the license for commercial use of the article according to the Open Access License (CC BY-NC-ND 4.0), which has to be signed before publication. The copyright form is available in the Internet Editorial System.
The publication in the journal is free of charge. A sample copy of the journal will be sent to the corresponding author free of charge. Authors have an option to pay for colour pages in printed version of their articles.
Editorial Office of Metrology and Measurement Systems
Military University of Technology
Faculty of Electronics
gen. Sylwestra Kaliskiego 2