Scope and metrics
Metrology and Measurement Systems is an international journal, peer-reviewed, quarterly-published, launched in 1988. Since 2001 it has appeared in English. Since 2024, the journal has been published exclusively in electronic form on the platform of the Electronic Library of the Polish Academy of Sciences. It operates on a diamond open access model where authors do not pay any publication fees, and articles are made available open access under the terms of the Creative Commons Attribution Non Commercial-No Derivatives License (CC BY-NC-ND 4.0).
The Journal is indexed in Journal Citation Reports and Web of Science Master Journal List (Clarivate Analytics formerly Thomson Reuters), INSPEC, Scopus, Index Copernicus, Google Scholar, CSA Technology Research, High Tech Research Database, Solid State & Superconductivity.
Impact Factor for 2023: 1
5-Year Impact Factor: 1
The Polish Ministry of Science and Higher Education: 100 points
Contributions are invited on all aspects of research, development and applications of the measurement science and associated technology.
The list of topics covered includes: theory, general principles and applications of measurement; measurement of physical, chemical and biological quantities; medical measurements; sensors and transducers; measurement data acquisition; measurement signal transmission; processing and data analysis; measurement systems and embedded systems; design, manufacture and evaluation of measurement instrumentation. Manuscripts sent for publication in the journal should emphasize the novelty of presented methods and/or techniques, and demonstrate their performance through experimental tests, reliable simulations or numerical examples. Articles directly concerning measurement process should contain adequate analysis of measurement uncertainty.
A cover letter with clear explanation of scientific novelty, significance and utility of solutions proposed in the manuscript sent for publication is strongly recommended. Articles based on substantially extended and updated contributions presented at scientific conferences, or strongly related to previous authors’ works, must be accompanied with a cover letter file which should explain in details changes made in the manuscript in comparison with original conference paper and highlight the novelty in reference to other authors’ works.
The average publication cycle is 6 months.
Article types
- review papers presenting the current stage of the knowledge within the scope of the journal (max. 24 edited pages, approximately 3000 characters each),
- research papers reporting original scientific or technological advancements in the field of metrology (max. 16 pages),
- papers based on extended and updated contributions presented at scientific conferences (max. 16 pages),
- short notes, i.e. book reviews, conference reports, short news (max. 2 pages).
Frequency
Metrology and Measurement Systems is a quarterly journal and publishes 4 issues per year. However, articles accepted for publication are published in electronic version immediately (with assigned DOI number).
Peer review
Each submitted manuscript is subject to a single-blind peer-review procedure (reviewers know the identity of authors, but authors do not know the identity of reviewers), and the publication decision is based on the reviewers’ comments. If necessary, the authors may be invited to revise their manuscripts. In the case of revisions, we require the authors to include an explanation letter with detailed responses to the reviewers’ and editor’s comments and to clearly mark in the manuscript the changes made.
We stipulate that before submitting a paper for review, our editors verify the scope of the subject matter and its relevance to the field of Instrumentation and Measurement. An essential criterion for the evaluation of submitted manuscripts is their potential impact on the research field, measured by the number of repeated quotations. Such papers are preferred at the evaluation and publication stages.
Our Internet Editorial System website provides Authors with up-to-date information on progress of reviewing process.
Open access
Contact
E-mail: metrology@wat.edu.pl
Post address:
Editorial Office of Metrology and Measurement Systems
Military University of Technology
Faculty of Electronics
gen. Sylwestra Kaliskiego 2
00-908 Warsaw
Poland